Ascentia Imaging is pioneering the development of real-time wide-field-of-view nanometer precision micro-optic multi-aperture metrology technology. The goal is to be able to measure objects with 5 nm rms precision. Our approach to this problem is to utilize an array of micro-imagers forming a non-classical image that maximize the image's information content that relates directly to the localization task and rejects the information that is irrelevant to this task. Through the use of joint optimization techniques - one of Ascentia's core competencies - the imaging system design optimizes the information content that is relevant to the task. This allows the digital signal processing to operate on this information rather than on the sampled image as a whole.
Nano Metrology
The concept and technology of non-planar imaging systems utilizing arrays of small inexpensive sensors, such as found in cell phone cameras, has been pioneered by Ascentia Imaging. We call this technology "3D Optics." The graphic above illustrates the concept. This type of imager is scalable, which means that the size can range from a golf ball with a few megapixels to a basketball having gigapixels.The field of view as well as the resolution of the imager are selectable by using only a subset of the imager's cameras.
3D Optics

Computational Imaging

Classical Optical Designs
New Frontiers In Optics™
3D Optics
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Nano Metrology/3D Optics
Nano Metrology
3D Optics